PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Schneider, C.M., Wiemann, C., Patt, M., Feyer, V., Plucinski, L., Krug, I.P., Escher, M., Weber, N., Merkel, M., Renault, O., Barrett, N. "Expanding the View into Complex Material Systems: From micro-ARPES to nanoscale HAXPES" Journal of Electron Spectroscopy and Related Phenomena., 185: 330–339. (2012).