PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Tuilier, M.H., Pac, M.J., Girleanu, M., Covarel, G., Arnold, G., Louis, P., Rousselot, C., Flank, A.M. "Electronic and atomic structures of Ti1-xAlxN thin films related to their damage behavior" Journal of Applied Physics., 103(8): art.n° 083524. (2008).