PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Tanner, C., Alarcón, M.G., Rodgers, G., Humbel, M., Kuo, W., Deyhle, H., Bausch, B., Weitkamp, T., Engelhardt, B., Proulx, S.T., Kurtcuoglu, V., Müller, B. "Determining the thickness of convoluted cell layers in microtomography" Current Directions in Biomedical Engineering., 11(1): 178-181. (2025).