PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Marinova, M., Rault, J., Gloter, A., Nemšák, S., Palsson, G., Rueff, J.P., Fadley, C.S., Carretero, C., Yamada, H., March, K., Garcia, V., Fusil, S., Barthélémy, A., Stephan, O., Colliex, C., Bibes, M. "Depth profiling charge accumulation from a ferroelectric into a doped Mott insulator" Nano Letters., 15(4): 2533–2541. (2015).