Dernière mise à jour : 30/10/2025
Chiuzbaian, S. G., Hague, C.F., Avila, A., Delaunay, R., Jaouen, N., Sacchi, M., Polack, F., Thomasset, M., Lagarde, B., Nicolaou, A., Brignolo, S., Baumier, C., Lüning, J., Mariot, J.M. "Design and performance of AERHA, a high acceptance high resolution soft x-ray spectrometer" Review of Scientific Instruments., 85(4): art.n° 043108. (2014).
Choueikani, F., Lagarde, B., Delmotte, F., Krumrey, M., Bridou, F., Thomasset, M., Meltchakov, E., Polack, F. "High-efficiency B4C/Mo2C alternate multilayer grating for monochromators in the photon energy range from 0.7 to 3.4 keV" Optics Letters., 39(7): 2141-2144. (2014).
Emprin, B., Troussel, P., Soullié, G., Stemmler, P., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F. "Characterization of subnanometric layers by grazing incidence X-ray reflectometry" Thin Solid Films., 556: 54–60. (2014).
Sampaio, J.M., Madeira, T.I., Marques, J.P., Parente, F., Costa, A.M., Indelicato, P., Santos, J.P., Lépy, M.C., Ménesguen, Y. "Approaches for theoretical and experimental determinations of K -shell decay rates and fluorescence yields in Ge" Physical Review A., 89(1): art.n° 012512. (2014).
Stanescu, S., Mocuta, C., Merlet, F., Barbier, A. "Two-dimensional resonant magnetic soft X-ray scattering set-up for extreme sample environment" Journal of Synchrotron Radiation., 20(1): 181-189. (2013).
Medjoubi, K., Leclercq, N., Langlois, F., Buteau, A., Lé, S., Poirier, S., Mercere, P., Kewish, C.M., Somogyi, A. "Development of fast parallel multi-technique scanning X-ray imaging at Synchrotron Soleil" Journal of Physics Conferences Series., 463: art.n° 012031. (2013).
Idir, M., Dovillaire, G., Mercere, P. "Ex- and In-situ Metrology Based on the Shack-Hartmann Technique for Sub-nanometric Metrology" Synchrotron Radiation News., 26(5): 23-29. (2013).
Medjoubi, K., Bonissent, A., Leclercq, N., Langlois, F., Mercere, P., Somogyi, A., Barry Lai "Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography" Paper presented at the X-Ray Nanoimaging: Instruments and Methods, San Diego (US), August 25, 2013. Barry Lai, 8851: art.n° 88510P. (2013).
Mohacsi, I., Karvinen, P., Vartiainen, I., Diaz, A., Somogyi, A., Kewish, C.M., Mercere, P., David, C., Barry Lai "High efficiency x-ray nanofocusing by the blazed stacking of binary zone plates" Paper presented at the X-Ray Nanoimaging: Instruments and Methods, San Diego (US), August 25, 2013. Barry Lai, 8851: art.n° 88510Z. (2013).
Rizzi, J., Mercère, P., Idir, M., Da Silva, P., Vincent, G., Primot, J. "X-ray phase contrast imaging and noise evaluation using a single phase grating interferometer" Optics Express., 21(14): 17340-17351. (2013).