Dernière mise à jour : 30/10/2025
Idir, M., Brochet, S., Delmotte, A., Lagarde, B., Mercère, P., Moreno, T., Polack, F., Thomasset, M. "Le pôle de métrologie de SOLEIL." Journal de Physique IV., 138: 265-274. (2006).
Mercère, P., Idir, M., Moreno, T., Cauchon, G. "X-ray wave-front measurements and X-ray active optics" Synchrotron Radiation News., 19(4): 28-32. (2006).
Idir, M., Mercère, P., Moreno, T., Delmotte, A. "Metrology and test beamline at SOLEIL" Synchrotron Radiation News., 19(4): 18-23. (2006).
Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Brochet, S., Polack, F., Idir, M., Mercère, P., Moreno, T. "Shack-Hartmann long trace profiler : A new generation of 2D LTP" Synchrotron Radiation News., 19(4): 24-27. (2006).
Mercère, P., Idir, M., Moreno, T., Cauchon, G., Dovillaire, G., Levecq, X., Bucourt, S. "X-Ray Wavefront Measurements And Automatic Alignment Of X-Ray Beamlines" Paper presented at the Third International Workshop on Metrology for X-ray Optics- SRI 2006. Abstract No.34030008. (2006).
Thomasset, M., Brochet, S., Idir, M., Moreno, T., Polack, F., Carré, J.F., AIP "Metrology results on multielectrod bimorph mirrors" Paper presented at the Third International Workshop on Metrology for X-ray Optics- SRI 2006. AIP, Abstract n° 34050015. (2006).
Flank, A.M., Cauchon, G., Lagarde, P., Bac, S., Janousch, M., Wetter, R., Dubuisson, J.M., Idir, M., Langlois, F., Moreno, T., Vantelon, D. "LUCIA, a microfocus soft XAS beamline" Nuclear Instruments and Methods B., 246(1): 269-274. (2006).
Mercère, P., Idir, M., Moreno, T., Cauchon, G., Dovillaire, G., Levecq, X., Couvet, L., Bucourt, S., Zeitoun, P. "Automatic alignment of a Kirkpatrick-Baez active optic by use of a soft X-ray Hartmann wave-front sensor" Optics Letters., 31(2): 199-201. (2006).
Mercère, P., Bucourt, S., Cauchon, G., Douillet, D., Dovillaire, G., Goldberg, K.A., Idir, M., Levecq, X., Moreno, T., Naulleau, P.P., Rekawa, S., Zeitoun, P., Assoufid L., Takacs P.Z., Taylor J.S. "X-ray beam metrology and X-ray optic alignment by Hartmann wavefront sensing" Paper presented at the SPIE's 50th Annual Meeting, X-Ray Systems and Technologies : Advances in Metrology for X-Ray and EUV Optics. Assoufid L., Takacs P.Z., Taylor J.S., 5921: 63-72. (2005).
Farys, V., Schiavone, P., Polack, F., Idir, M., Bertolo, M., Bianco, A., La-Rosa, S., Cautero, G., Vannuffel, C., Quesnel, E., Muffato, V. "Highly sensitive detection technique of buried defects in extreme ultraviolet masks using at-wavelength scanning dark-field microscopy" Applied Physics Letters., 87(2): art.n° 024102. (2005).