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Publications

Dernière mise à jour : 23/01/2026
E.g., 03/02/2026
E.g., 03/02/2026
Polack, F., Lagarde, B., Idir, M., Liard, A., Jourdain, E., Jae-Young Choi & Seungyu Rah "Variable Groove Depth Gratings and their Applications in Soft X-ray Monochromators" Paper presented at the Ninth International Conference on Synchrotron Radiation Instrumentation 28 May-2 June 2006. Jae-Young Choi & Seungyu Rah, 879: 639-642. (2006).
Polack, F., Lagarde, B., Idir, M., Liard, A., Jourdain, E., Roulliay, M., Delmotte, A., Gautier, J., Ravet-Krill, M. F., Jae-Young Choi & Seungyu Rah "Alternate Multilayer Gratings with Enhanced Diffraction Efficiency in the 500-5000 eV Energy Domain" Paper presented at the Ninth International Conference on Synchrotron Radiation Instrumentation 28 May-2 June 2006. Jae-Young Choi & Seungyu Rah, 879: 489-492. (2006).
Desjardins, K., Hustache, S., Polack, F., Moreno, T., Idir, M., Dubuisson, J.M., Daguerre, J.P., Giorgetta, J.L., Thoraud, S., Delmotte, F., Ravet-Krill, M. F., Jae-Young Choi & Seungyu Rah, "The DiagOn : an Undulator Diagnostic for SOLEIL Low Energy Beamlines" Paper presented at the Ninth International Conference on Synchrotron Radiation Instrumentation 28 May-2 June 2006. Jae-Young Choi & Seungyu Rah, 879: 1101-1104. (2006).
Hecquet, C., Roulliay, M., Delmotte, F., Ravet-Krill, M. F., Hardouin, A., Idir, M., Zeitoun, P. "EUV large spectrum reflectometry for the metrology of optics" Journal de physique IV., 138: 259-264. (2006).
Idir, M., Brochet, S., Delmotte, A., Lagarde, B., Mercère, P., Moreno, T., Polack, F., Thomasset, M. "Le pôle de métrologie de SOLEIL." Journal de Physique IV., 138: 265-274. (2006).
Mercère, P., Idir, M., Moreno, T., Cauchon, G. "X-ray wave-front measurements and X-ray active optics" Synchrotron Radiation News., 19(4): 28-32. (2006).
Idir, M., Mercère, P., Moreno, T., Delmotte, A. "Metrology and test beamline at SOLEIL" Synchrotron Radiation News., 19(4): 18-23. (2006).
Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Brochet, S., Polack, F., Idir, M., Mercère, P., Moreno, T. "Shack-Hartmann long trace profiler : A new generation of 2D LTP" Synchrotron Radiation News., 19(4): 24-27. (2006).
Mercère, P., Idir, M., Moreno, T., Cauchon, G., Dovillaire, G., Levecq, X., Bucourt, S. "X-Ray Wavefront Measurements And Automatic Alignment Of X-Ray Beamlines" Paper presented at the Third International Workshop on Metrology for X-ray Optics- SRI 2006. Abstract No.34030008. (2006).
Thomasset, M., Brochet, S., Idir, M., Moreno, T., Polack, F., Carré, J.F., AIP "Metrology results on multielectrod bimorph mirrors" Paper presented at the Third International Workshop on Metrology for X-ray Optics- SRI 2006. AIP, Abstract n° 34050015. (2006).