Dernière mise à jour : 30/10/2025
Idir, M., Mercère, P., Moreno, T., Delmotte, A., Da Silva, P., Modi, M.H. "Metrology and Tests beamline at SOLEIL Design and first results" Paper presented at the SRI 2009, 10th International Conference on Synchrotron Radiation Instrumentation, Melbourne, Australia, 27 September - 2 October 2009. 1234: 485-488. (2010).
Idir, M., Potier, J., Fricker, S., Snigirev, A., Snigireva, I., Modi, M.H. "X-ray Phase Contrast analysis—Digital wavefront development" Paper presented at the SRI 2009, 10th International Conference on Synchrotron Radiation Instrumentation, Melbourne, Australia, 27 September - 2 October 2009. 1234: 677-680. (2010).
Modi, M.H., Idir, M. "Shape error analysis for reflective nano focusing optics" Paper presented at the SRI 2009, 10th International Conference on Synchrotron Radiation Instrumentation, Melbourne, Australia, 27 September - 2 October 2009. 1234: 681-684. (2010).
Mercère, P., Idir, M., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., Sauvageot, P. "Hartmann wavefront sensor and adaptive x-ray optics developments for synchrotron applications" Paper presented at the Adaptive X-Ray Optics, San Diego, California, USA, 3 August 2010. 7803: art.n° 780302. (2010).
Thomasset, M., Moreno, T., Capitanio, B., Idir, M., Bucourt, S. "In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation" Nuclear Instruments and Methods A., 616(2-3): 197-202. (2010).
Idir, M., Fricker, S., Modi, M.H., Potier, J. "X-ray digital wavefront sensor development" Nuclear Instruments and Methods A., 616(2-3): 255-260. (2010).
Idir, M., Mercère, P., Modi, M.H., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., Sauvageot, P. "X-ray active mirror coupled with a Hartmann Wavefront Sensor" Nuclear Instruments and Methods A., 616(2-3): 162-171. (2010).
Reverchon, J.L., Bansropun, S., Truffer, J.P., Costard, E., Frayssinet, E., Brault, J., Duboz, J.Y., Giuliani, A., Idir, M. "Performances of AlGaN-based focal plane arrays from 10nm to 200nm" Paper presented at the Space Missions and Technologies, 5 April 2010, Orlando, Florida, USA. 7691: art.n° 769109. (2010).
Modi, M.H., Mercère, P., Idir, M. "High precision surface metrology using a phase retrieval method" Journal of Physics Conferences Series., 186: art.n° 012068. (2009).
Nagler, B., Zastrau, U., Fäustlin, R.R., Vinko, S.M., Whitcher, T., Nelson, A.J., Sobierajski, R., Krzywinski, J., Chalupsky, J., Abreu, E., Bajt, S., Bornath, T., Burian, T., Chapman, H., Cihelka, J., Döppner, T., Düsterer, S., Dzelzainis, T., Fajardo, M., Förster, E., Fortmann, C., Galtier, E., Glenzer, S.H., Göde, S., Gregori, G., Hajkova, V., Heimann, P., Juha, L., Jurek, M., Khattak, F.Y., Khorsand, A.R., Dorota Klinger, D., Kozlova, M., Laarmann, T., Lee, H.J., Lee, R.W., Meiwes-Broer, K.H., Mercère, P., Murphy, W.J., Przystawik, A., Redmer, R., Reinholz, H., Riley, D., Röpke, G., Rosmej, F., Saksl, K., Schott, R., Thiele, R., Tiggesbäumker, J., Toleikis, S., Tschentscher, T., Uschmann, I., Vollmer, H.J., Wark, J.S. "Turning solid aluminium transparent by intense soft X-ray photoionization" Nature Physics., 5(9): 693-696. (2009).