Dernière mise à jour : 18/09/2025
Kukk, E., Niskanen, J., Travnikova, O., Berholts, M., Kooser, K., Peng, D., Ismail, I., Piancastelli, M.N., Püttner, R., Hergenhahn, U., Simon, M. "Orientational anisotropy due to molecular field splitting in sulfur 2p photoemission from CS2 and SF6 -- theoretical treatment and application to photoelectron recoil." PCCP - Physical Chemistry Chemical Physics., 26(32): 21810-21820. (2024).
Barrett, N., Hamouda, W., Lubin, C., Laguerre, J., Carabasse, C.., Vaxelaire, N., Coignus, J., Martin, S., Grenouillet, L. "Oxygen vacancy engineering in Si-doped, HfO2 ferroelectric capacitors using Ti oxygen scavenging layers" Applied Physics Letters., 125(4): art.n° 043502. (2024).
Gutièrrez–Llorente, A., Raji, A., Zhang, D., Divay, L., Gloter, A., Gallego, F., Galindo, C., Bibes, M., Iglesias, L. "Toward Reliable Synthesis of Superconducting Infinite Layer Nickelate Thin Films by Topochemical Reduction" Advanced Materials., 11(24): art.n° 2309092. (2024).
Balan, C., Fischer, J., Gueneau, C., Fassatoui, A., Rueff, J.P., Ceolin, D., De-Santis, M., Vogel, J., Ranno, L., Béa, H., Pizzini, S. "Using hard-x-ray photoelectron spectroscopy to measure the oxidation state of gated Co/AlOx interfaces" Physical Review Applied., 21(6): art.n° 064023. (2024).
Manzanillas, L., Ablett, J.M., Choukroun, M., Iguaz, F. J., Rueff, J.P. "Development of an x-ray polarimeter at the SOLEIL synchrotron" Review of Scientific Instruments., 95(5): art.n° 053302. (2024).
Simon, M. "Dynamique ultrarapide de molécules isolées excitées" Actualité Chimique., (494): 20-24. (2024).
Ismail, I., Moussaoui, R., Vacheresse, R., Marchenko, T., Travnikova, O., Guillemin, R., Verma, A., Velasquez, N., Peng, D., Ringuenet, H., Penent, F., Püttner, R., Céolin, D., Rueff, J.P., Simon, M. "MOSARIX: Multi-crystal spectrometer in the tender x-ray range at SOLEIL synchrotron" Review of Scientific Instruments., 95(5): art.n° 053103. (2024).
Gorelov, V., Reining, L., Feneberg, M., Goldhahn, R., Schleife, A., Lambrecht, W.R.L., Gatti, M. "Author Correction: Delocalization of dark and bright excitons in flat-band materials and the optical properties of V2O5" npj Computational Materials., 10: art.n° 85. (2024).
Fantin, R., Van Roekeghem, A., Rueff, J.P., Benayad, A. "Surface analysis insight note: Accounting for X-ray beam damage effects in positive electrode-electrolyte interphase investigations" Surface and Interface Analysis., 56(6): 353-358. (2024).
Fantin, R., Jousseaume, T., Ramos, R., Lefevre, G., Van Roekeghem, A., Rueff, J.P., Benayad, A. "Depth-Resolving the Charge Compensation Mechanism from LiNiO2 to NiO2" ACS Energy Letters., 9(4): 1507–1515. (2024).