Dernière mise à jour : 05/11/2025
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Sadat, T., Faurie, D., Tingaud, D., Mocuta, C., Thiaudiere, D., Dirras, G. "Fracture behavior of Ni-W alloy probed by in situ synchrotron X-ray diffraction" Materials Letters., 239: 116-119. (2019).
Ben Yahia, B., Amara, M.S., Gallard, M., Burle, N., Escoubas, S., Guichet, C., Putero, M., Mocuta, C., Richard, M.I., Chahine, R., Sabbione, C., Bernard, M., Fellouh, L., Noé, P., Thomas, O. "In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallization" Micro and Nano Engineering., 1: 63-67. (2018).
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Gueriau, P., Jauvion, C., Mocuta, C. "Show me your yttrium, and I will tell you who you are: implications for fossil imaging" Palaeontology., 61(6): 981-990. (2018).
Jedrecy, N., Aghavnian, T., Moussy, J.B., Magnan, H, Stanescu, D., Portier, X., Arrio, M.A., Mocuta, C., Belkhou, R., Ohresser, P., Barbier, A. "Cross-Correlation between Strain, Ferroelectricity, and Ferromagnetism in Epitaxial Multiferroic CoFe2O4/BaTiO3 Heterostructures" ACS Applied Materials & Interfaces., 10(33): 28003–28014. (2018).
Cook, P.K., Mocuta, C., Dufour, E., Languille, M.A., Bertrand, L. "Full‐section otolith microtexture imaged by local‐probe X‐ray diffraction" Journal of Applied Crystallography., 51(4): 1182-1196. (2018).
Noé, P., Hippert, F. "Structure and Properties of Chalcogenide Materials for PCM" In Phase Change Memory. Device Physics, Reliability and Applications: 125-179: Springer, 2018. ISBN: 978-3-319-69053-7