Dernière mise à jour : 24/10/2025
Chang, Y.W., Cheng, Y., Helfen, L., Xu, F., Tian, T., Scheel, M., Di Michiel, M., Chen, C., Tu, K.N., Baumbach, T. "Electromigration Mechanism of Failure in Flip-Chip Solder Joints Based on Discrete Void Formation" Scientific Reports., 7: art.n° 17950. (2017).
Weitkamp, T., Scheel, M., Giorgetta, J.L., Joyet, V., Le Roux, V., Cauchon, G., Moreno, T., Polack, F., Thompson, A., Samama, J.P. "The tomography beamline ANATOMIX at Synchrotron SOLEIL" Journal of Physics Conferences Series., 849: art.n° 012037. (2017).
Olbinado, M.P., Just, X., Gelet, J.L., Lhuissier, P., Scheel, M., Vagovic, P., Sato, T., Graceffa, R., Schulz, J., Mancuso, A., Morse, J., Rack, A. "MHz frame rate hard X-ray phase-contrast imaging using synchrotron radiation" Optics Express., 25(12): 13857-13871. (2017).
Daudin, R., Terzi, S., Lhuissier, P., Tamayo, J., Scheel, M., Hari Babu, N., Eskin, D.G., Salvo, L. "Particle-induced morphological modification of Al alloy equiaxed dendrites revealed by sub-second in situ microtomography" Acta Materialia., 125: 303-310. (2017).
Finegan, D.P., Scheel, M., Robinson, J.B., Tjaden, B., Di Michiel, M., Hinds, G., Bretta, D.J.L., Shearing, P.R. "Investigating lithium-ion battery materials during overcharge-induced thermal runaway: an operando and multi-scale X-ray CT study" PCCP - Physical Chemistry Chemical Physics., 18(45): 30912-30919. (2016).
Pelliccia, D., Rack, A., Scheel, M., Cantelli, V., Paganin, D.M. "Experimental X-Ray Ghost Imaging" Physical Review Letters., 117(11): art.n° 113902. (2016).
Semprebon, C., Scheel, M., Herminghaus, S., Seemann, R., Brinkmann, M. "Liquid morphologies and capillary forces between three spherical beads" Physical Review E., 94(1): art.n° 012907. (2016).
Baranau, V., Zhao, S.C., Scheel, M., Tallarek, U., Schröter, M. "Upper bound on the Edwards entropy in frictional monodisperse hard-sphere packings" Soft Matter., 12(17): 3991-4006. (2016).
Finegan, D.P., Tudisco, E., Scheel, M., Robinson, J.B., Taiwo, O.O., Eastwood, D.S., Lee, P.D., Di Michiel, M., Bay, B., Hall, S.A., Hinds, G., Brett, D.J.L., Shearing, P.R. "Quantifying Bulk Electrode Strain and Material Displacement within Lithium Batteries via High-Speed Operando Tomography and Digital Volume Correlation" Advanced Science., 3(3): art.n° 1500332. (2016).
Rack, A., Scheel, M., Danilewsky, A.N. "Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakage" IUCrJ., 3(2): 108-114. (2016).