Dernière mise à jour : 27/06/2025
Weitkamp, T., Scheel, M., Giorgetta, J.L., Joyet, V., Le Roux, V., Cauchon, G., Moreno, T., Polack, F., Thompson, A., Samama, J.P. "The tomography beamline ANATOMIX at Synchrotron SOLEIL" Journal of Physics Conferences Series., 849: art.n° 012037. (2017).
Olbinado, M.P., Just, X., Gelet, J.L., Lhuissier, P., Scheel, M., Vagovic, P., Sato, T., Graceffa, R., Schulz, J., Mancuso, A., Morse, J., Rack, A. "MHz frame rate hard X-ray phase-contrast imaging using synchrotron radiation" Optics Express., 25(12): 13857-13871. (2017).
Daudin, R., Terzi, S., Lhuissier, P., Tamayo, J., Scheel, M., Hari Babu, N., Eskin, D.G., Salvo, L. "Particle-induced morphological modification of Al alloy equiaxed dendrites revealed by sub-second in situ microtomography" Acta Materialia., 125: 303-310. (2017).
Finegan, D.P., Scheel, M., Robinson, J.B., Tjaden, B., Di Michiel, M., Hinds, G., Bretta, D.J.L., Shearing, P.R. "Investigating lithium-ion battery materials during overcharge-induced thermal runaway: an operando and multi-scale X-ray CT study" PCCP - Physical Chemistry Chemical Physics., 18(45): 30912-30919. (2016).
Pelliccia, D., Rack, A., Scheel, M., Cantelli, V., Paganin, D.M. "Experimental X-Ray Ghost Imaging" Physical Review Letters., 117(11): art.n° 113902. (2016).
Semprebon, C., Scheel, M., Herminghaus, S., Seemann, R., Brinkmann, M. "Liquid morphologies and capillary forces between three spherical beads" Physical Review E., 94(1): art.n° 012907. (2016).
Baranau, V., Zhao, S.C., Scheel, M., Tallarek, U., Schröter, M. "Upper bound on the Edwards entropy in frictional monodisperse hard-sphere packings" Soft Matter., 12(17): 3991-4006. (2016).
Finegan, D.P., Tudisco, E., Scheel, M., Robinson, J.B., Taiwo, O.O., Eastwood, D.S., Lee, P.D., Di Michiel, M., Bay, B., Hall, S.A., Hinds, G., Brett, D.J.L., Shearing, P.R. "Quantifying Bulk Electrode Strain and Material Displacement within Lithium Batteries via High-Speed Operando Tomography and Digital Volume Correlation" Advanced Science., 3(3): art.n° 1500332. (2016).
Rack, A., Scheel, M., Danilewsky, A.N. "Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakage" IUCrJ., 3(2): 108-114. (2016).
Müller, B., Schulz, G., Deyhle, H., Stalder, A.K., Ilgenstein, B., Holme, M.N., Weitkamp, T., Beckmann, F., Hieber, S.E. "X-ray microscopy of soft and hard human tissues" AIP Conference Proceedings., 1696: art.n° 020010. (2016).