DIFFABS

Technical data

Energy range

3-23 keV for standard beam mode 
3-19 keV for microbeam mode

Energy Resolution (∆E/E)

∆E/E ~ 10^-4

Source

Bending magnet

Flux at the first optical element

1.10¹⁴ ph/s/0.1%bw @ 8 keV / 500mA ring current 
4. 10¹³ ph/s/0.1%bw @ 20 keV / 500mA ring current

Optics

Mains optics

Two bendable mirrors for harmonics rejection and meridian (vertical) focusing 
- Si(111) Double crystal monochromator (DCM) with bendable 2^nd crystal for sagital (horizontal) focusing 

Focusing optics  for microbeam mode 

- Kirkpatrick-Baez (KB) mirror (~ 10μm) 
- Circular Fresnel Zone Plate (sub-10μm beam size) 

Sample Environment

- 6+2 circles diffractometer (kappa geometry + analyzer crystal). Heavy load and cumbersome sample environment can be accommodated. 

-  motorized (x,y,z)-stage allowing the precise positioning and mapping of the sample +-12mm (or+-5cm, +-10cm, +-15cm)

- Several heating systems :

(laser heating + levitating chamber (study of melting of glasses, oxides and ceramics up to T ~3000 °C)

conventional furnaces for powders, thin films and bulk (up to 
1300°C)

- compact Peltier stage (T = -20°C to +50 °C) 
- biaxial tensile machine for stretchable thin films 
- optical microscope (sample visualisation and pre-alignment) for μbeam experiments

Beam characteristics on sample (flux and size)

standard mode

- several 10¹² ph/s @ 8kev / 500 mA ring current

~250x300μm² FWHM, 0.24 x 3.5 mrad², vert. × horiz. with Si(111) DCM 

microbeam mode

- 10⁹-10¹⁰ ph/s @ 8kev / 500 mA ring current

~10x10μm² FWHM, 2 x 1 mrad², vert. × horiz. using  KB 

Detectors

2D detectors : CIRPAD and XPAD S140

- Zero- dimensional (YAP or LaCl3 scintillators) 
- Zero- dimensional (Avalanche Photo Diode, APD) 
- thin Si diodes (I₀ monitors), 
- diodes (transmitted beam) for X-ray absorption experiments 
- 4-element SDD: silicon drift detector for X-ray fluorescence

+ additionnal (XPAD, MAR345 image plate, 4element SDD …) on-loan basis from Detectors Group, shared with other beamlines.