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Publications

Last update : 01.20.2026
E.g., 01/20/2026
E.g., 01/20/2026
Quertite, K., Lasri, K., Enriquez, H., Mayne, A.J., Bendounan, A., Dujardin, G., Trcera, N., Malone, W., El Kenz, A., Benyoussef, A., Kara, A., Oughaddou, H. "Atomic Structure of Sub-Monolayer NaCl Grown on Ag(110) Surface" Journal of Physical Chemistry C., 121(37): 20272–20278. (2017).
Jana, S., De Frutos, M., Davidson, P., Abécassis, B. "Ligand-induced twisting of nanoplatelets and their self-assembly into chiral ribbons" Science Advances., 3(9): art.n° e1701483 . (2017).
Allam, A., Maigre, L., Vergalli, J., Dumont, E., Cinquin, B., Alves de Sousa, R., Pajovic, J., Pinet, E., Smith, N., Herbeuval, J.P., Réfrégiers, M., Artaud, I., Pagès, J.M. "Microspectrofluorimetry to dissect the permeation of ceftazidime in Gram-negative bacteria" Scientific Reports., 7: art.n° 986. (2017).
Nandwani, N., Surana, P., Udgaonkar, J.B., Das, R., Gosavi, S. "Amino-acid composition after loop deletion drives domain swapping" Protein Science., 26(10): 1994–2002. (2017).
Cicconi, M.R., Neuville, D.R., Blanc, W., Lupi, J.F., Vermillac, M., de Ligny, D. "Cerium/aluminum correlation in aluminosilicate glasses and optical silica fiber preforms" Journal of Non-Crystalline Solids., 475: 85-95. (2017).
Cudazzo, P., Gatti, M. "Collective charge excitations of the two-dimensional electride Ca2N" Physical Review B., 96(12): art.n° 125131. (2017).
Webb, J.L., Hart, L.S., Wolverson, D., Chen, C., Avila, J., Asensio, M.C. "Electronic band structure of ReS2 by high-resolution angle-resolved photoemission spectroscopy" Physical Review B., 96(11): art.n° 115205. (2017).
Wang, W., Cantos-Fernandes, S., Lv, Y., Kuerban, H., Ahmad, S., Wang, C., Gigant, B. "Insight into microtubule disassembly by kinesin-13s from the structure of Kif2C bound to tubulin" Nature Communications., 8: art.n° 70. (2017).
Ginsburg, A., Shemesh, A., Millgram, A., Dharan, R., Levi-Kalisman, Y., Ringel, I., Raviv, U. "Structure of Dynamic, Taxol-Stabilized, and GMPPCP-Stabilized Microtubule" Journal of Physical Chemistry B., 121(36): 8427–8436. (2017).
Többens, D.M., Schorr, S. "The use of anomalous X-ray diffraction as a tool for the analysis of compound semiconductors" Semiconductor Science and Technology., 32(13): art.n° 103002. (2017).