Our equipment includes beamlines and support laboratories for preparation and instrumentation.
As accessible to novices as to experienced users; adaptable and ever-evolving; SOLEIL’s lightbeams exist for the analysis, characterization, and examination of materials.
They generate important gains in performance in comparison with laboratory tools, mainly in terms of:
- Quality and sensitivity of measurements
- Opportunities for microanalysis (at micron scale or even lower) and imagery (scanning of samples via micro-beam of light)
- Opportunity for simultaneous analysis via several complementary techniques
Some techniques, such as the spectroscopy of X-ray absorption, are also specific to the synchrotron beam; they constitute complementary means of acquiring new information on the materials studied.
Synchrotron techniques are also used in metrology for the calibration of optics and detectors, or in manufacturing for the production of micrometric-size devices in ratio to increased size (great height in comparison to lateral dimension).
