The SOLEIL Synchrotron School on X-ray Microscopy (SOLEMIO), to be held from May 2nd to 6th, 2011, at Synchrotron SOLEIL (Saint-Aubin, France), aims at providing a thorough background in synchrotron based microscopy methods to interested PhD students, Post-Docs and scientists working at European research institutions. The school will cover the general aspects of synchrotron radiation, X-ray optics and X-ray spectroscopy before discussing in detail the variety of existing X-ray microscopy techniques. The complementarity between X-ray and laboratory based microscopy techniques (AFM, SEM, TEM, optical microscopy etc) will be presented.
Plenary lectures will be complemented by hands-on experiences on X-ray and laboratory based microscopy techniques. In addition, a practical exercise on how to prepare a successful beam time proposal will be given as well as a poster session and a tour of SOLEIL.
The school, which will be held in English, is oriented towards young researchers from all scientific domains and examples presented during the lectures will cover the variety of existing applications. To better demonstrate the complementarity between X-ray and laboratory based microscopy techniques, the lectures will be organized around an annually changing topic which will be this time “Magnetic imaging and microscopy”.
A poster session will be organized during the school; the attendees are strongly advised to submit a short abstract.
