SixS (Surface Interface X-ray Scattering) is a wide-energy range (5 -20 keV) beamline dedicated to structural characterization of surfaces, interfaces (solid-solid or solid-liquid), as well as nano-objects in controlled environments by means of surface-sensitive x-ray scattering techniques, such as:
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Grazing Incidence X-ray Diffraction (GIXD)
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Crystal Truncation Rods (CTR)
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Grazing Incidence Small Angle X-ray Scattering (GISAXS)
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Anomalous Surface X-ray Scattering
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X-ray Reflectivity (XRR)
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Coherent Diffraction
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Magnetic Surface X-ray Scattering (in the near future)
Experimental end-stations:
- MED: a multi-environment diffractometer is available which can accommodate various sample environments, such as high-pressure reactivity chambers, electrochemical cells, Langmuir troughs. It allows for scatvertical and horizontal diffraction geometry for surface / interface diffraction.
- UHV: the diffractometer is coupled to stationary assembly of UHV chambers (currently being installed) ; it is a unique design, and consists of an assembly of three chambers equipped with the standard UHV tools (evaporators, ion-guns, etc.) and specific instruments (Scanning Tunneling Microscope (STM), Low Energy Electron Diffraction (LEED), Auger Electron Spectroscopy (AES).
