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Research Contents > Beamlines > SEXTANTS > description
Description Technical data
Scientific Opportunities Contacts

Description

The purpose of the beamline is first and foremost to deliver the highest flux possible within a small focused beam over the 100 to 1000 eV spectral range, with good performance over an extended range going from 50 to 1700 eV. The flux at the sample position should exceed 1013 photons.s-1 over the optimized energy range.

This will involve two tunable undulators in a medium-length straight section and a monochromator designed to provide a resolving power in excess of 10000 at full throughput in a ~ 20 µm x 80 µm spot at the exit slit. Further, a set of refocusing mirrors (some of them bendable) will be available to focus the beam to three distinct working areas at two branch lines. Switching mirrors will enable the alternate use of the two branch lines. Refocusing optics will be adapted to each experimental technique. A very small vertical spot (~2 µm) will be necessary for high resolution inelastic scattering. A more symmetric spot (80 µm x 50 µm H x V) will provide optimum performance for coherent scattering. Finally, elastic scattering and diffraction experiments can require different conditions. Bendable mirrors will make it possible to adjust the focal distance, spotsize or beam divergence to the specific needs. Many experiments will be dealing with magnetic samples or involving orbital symmetry selection, thus helical undulators providing variable polarization have been specified.

The beamline will serve three types of experiment involving four instruments, three of them already financed through CNRS, ANR and cooperation with outside laboratories.  
 
- Resonant inelastic x-ray scattering (RIXS)
- X-ray resonant magnetic scattering (XRMS), 2 instruments
- Coherent x-ray scattering and Fourier transform holography

These are photon-in-photon-out resonant techniques, highly appropriate to the assessment of element specific magnetic properties under applied magnetic fields, with tunable bulk versus surface sensitivity.

 

Technical Data
Energy range   50 – 1700 eV
 

Energy Resolution

 

E/ΔE > 104 up to 1200 eV 
 

Source  

Full range: 50 - 1700 eV
Optimized: 70 - 1500 eV
 

Polarization  

Circular left/right, Linear horizontal/vertical
 

Flux on first optical
element
 
 

2×1015 Phot/s/0.1%bw @ 100eV

Flux on sample  

1×1014 (100 eV) - 2×1013 (1000 eV) ph./s/0.1% bw (estimates)
  

Optical elements  

M1 A/B : plane/spherical mirrors in horizontal deviation
Monochromator: 5 VLS plane gratings + M2 (spherical mirror)
M3/M6 toroidal switching mirrors on hexapod, feeding two branches, one for inelastic (M3), the other for elastic (M6) scattering.
 

Three experimental work areas

  A. Inelastic scattering branch. Elliptical refocusing mirror.
B. Elastic scattering branch. Intermediate focal point (M6).
C. Elastic scattering branch. Two bendable refocusing mirrors
 

Beam size at experimental work areas (h×v)

 

A. 80×2 μm2
B. 80×50 μm2
C. between 90×15 μm2 and 190x30 μm2 (bendable mirrors)
 

Endstations

  A. RIXS spectrometer.
B. Coherent scattering (FTH) or resonant scattering (IRMA)
C. Resonant scattering (RESOXS, IRMA) or user equipment

 

Scientific Opportunities
Resonant Inelastic Xray
Scattering (RIXS)
 
  • Detailed analysis of radiative decay channels following a resonant excitation
     
  • Hihly correlated materials – magnetic materials
     
  • Investigation of low-lying excitations associated with the ground state, analogous to optical spectroscopy, with element selectivity (intermediate state core-hole)
     
  • Possibility of band mapping with bulk sensitivity
     
  • Resolving power in excess of 5000 and up to 8000 on the optimized energy range
     
Soft X-ray scattering
and Resonant Magnetic
Scattering (XRMS)
 
  • Inherent sensitivity to structural properties 
     
  • Element selectivity and sensitivity to electronic properties
     
  • Sensitivity to magnetic structure (magnetization profile, roughness, domain size)
     
  • Large magneto-optical effects at soft X-ray resonances
     
  • High sensitivity (thin layers, diluted materials) and tunable probing depth (buried layers)
     
  • Imperviousness to strong or time dependent magnetic fields and to charging effects

The Sextants beamline hosts two reflectometers, RESOXS (low-T, high fields, ultra high vacuum) and IRMA (compact to fit in B working area, quick access in high vacuum).
 

Imaging by coherent X-ray
scattering and Fourier
Transform Holography (FTH)
 
  • High spatial resolution (potential sub 10 nm)
     
  • Versatile sample environments (magnetic fields, temperature, controlled atmosphere)
     
  • Imperviousness to vibrations and thermal drifts over an extended energy range

FTH imaging of magnetic domains with spatial resolution better than 50nm was achieved during the commissioning of the Sextants beamline.
 
Future developments:

  • new FTH dedicated chamber in 2011
     
  • implementation of coherent scattering experiments in reflectivity mode (IRMA setup)
     
  • phase retrieval microscopy, ptychography and microscopy with curved wave fronts.

 

Contacts
Nicolas Jaouen
(Principal beamline scientist)
 
Tel:+33(0)1 69 35 96 80 nicolas.jaouen@synchrotron-soleil.fr
Maurizio Sacchi
(Beamline scientist) 
 
Tel: +33(0)1 69 35 96 81 maurizio.sacchi@synchrotron-soleil.fr
Roland Gaudemer
(Beamline assistant engineer)
 
Tel: +33(0)1 69 35 96 97 roland.gaudemer@synchrotron-soleil.fr
Horia Popescu
(Beamline scientist)
 
Tel: +33(0)1 69 35 81 11 horia.popescu@synchrotron-soleil.fr

Beamline Phone Numbers

RIXS hutch:+33(0)1 69 35 81 58
XRMS hutch:+33(0)1 69 35 81 59
Fax:+33(0)1 69 35 94 56
 
 

P.H.D. students: Stefania Brignolo (Paris VI), Cédric Baumier (Paris VI) and Marta Elzo (Grenoble)


Research associates:
- Coryn F. Hague, Jan Lüning, Sorin Chiuzbaian and Renaud Delaunay (LCP-MR, Paris VI)  
- Jean-Marc Tonnerre, Stéphane Grenier and Stephanie Garaudee (Institut Néel, Grenoble)

Technical Coordinator: Aurélien Delmotte  Tel:+33(0)1 69 35 91 29 

Synchrotron SOLEIL
L'orme des Merisiers
Saint-Aubin - BP48
91192 GIF-sur-YVETTE CEDEX

 

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