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MICROSCOPIE X-MOUS beamline

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X-PEEM: A microscope between ELETTRA and SOLEIL  
 

In 2003, a collaboration and research agreement between the CNRS and the SOLEIL national synchrotron was drawn up. This also included ELETTRA, the Italian synchrotron based in Trieste. The purpose of this agreement is to establish a formal collaboration between French and Italian research groups in the field of x-ray microscopy, and X-PEEM microscopy in particular (X-ray Photo-Emitted Electron Microscopy). SOLEIL’s X-PEEM microscope was therefore able to be installed on the French branch of the Nanospectroscopy beamline at ELETTRA whilst waiting for the soft x-ray microscopy beamline to be built at SOLEIL, where it is due to be installed in late 2010.


 
 
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XMCD-PEEM evidence of the manipulation of multibit-states in single magnetic dots

 

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