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Samples

X-PEEM samples:

The samples characterized by X-PEEM at HERMES are mounted on ELMITEC cartridges and are therefore submitted to the associated spatial constraints. Hence the thickness should not exceed 4 mm and the lateral dimansions 1x1 mm² or 1.2 cm diameter.

It is more desirable to have a conductive sample (or capping layer) to avoid charging effects.

 

Specifications

XPEEM preparation chamber:

  • Heater stage (up to 2000 K)
  • Ar+ ion gun for sputtering
  • Various gas inlets (e.g. oxygen)
  • Sample carrousel (up to 6 samples)

XPEEM microscope environment:

  • Ultra-high vacuum environment (10-11 mbar)
  • Motorized (X,Y) translation (± 2500 µm)
  • Motorized azimuthal rotation (0 – 360°)
  • Temperature control (115 K – 2000 K)
  • In situ current injection / magnetic field foreseen
  • In-situ electric polarization foreseen
  • In-situ evaporation with e-beam & Knudsen evaporators
  • Hg lamp (4.9 eV), He lamp foreseen (21.6 eV)

XPEEM microscope specifications:

  • Full field imaging (fast acquisition time)
  • Fields of view from 50 µm to 2.5 µm
  • Resolution in LEEM mode < 10 nm
  • Resolution in PEEM mode < 30 nm
  • Analyzer resolution: 100 meV (50 meV ultimate)

Characterization techniques catalogue:

  • Surface sensitive (< 10 nm probed depth)
  • Morphology and crystal structure with LEEM and µ-LEED
  • Local absorption spectroscopy using XAS and XANES
  • Local electronic structure with XPS, RPES, ARPES and PED
  • Imaging of ferro/antiferromagnetic domains using dichroism (e.g. XMCD, XMLD, XLD)

 

Beam calendar
4th Semester 2010  
  • Finalizing the call for tender STXM
  • Approval of the Final design of the monochromator
  • KB mirror order
  • Hutches installation
  • Installation of HU42 undulator
  • Diagnostic system order
1st Semester 2011  
  • Servitudes and air conditioning
  • STXM Order
  • Study of vibration, design of dumpers….
  • Final installation of the support lab
  • Radioprotection test
  • FIRST BEAM from the undulator HU42
2nd Semester 2011  
  • Installation of HU64 undulator
  • Tests and commissioning of the undulator
  • Tests of Diagnostic system
  • Delivery and tests of the LEEM-PEEM microscope
3rd Semester 2011  
  • Diagnostic system installation 
  • Delivery and installation of the first Mirror M1 
  • Test and commissioning of M1 
  • FIRST BEAM from M1 mirrors 
  • Acceptance test of the Monochromator 
  • Delivery of the Monochromator
4th Semester 2011  
  • Tests and commissioning of the Monochromator
  • FIRST BEAM from the monochromator 
  • Delivery and tests of M4,5 deflection mirrors 
  • Delivery and tests of KB mirrors
1st Semester 2012  
  • FIRST BEAM ON THE X-PEEM 
  • Commissioning of the beamline starts
2nd Semester 2012  
  • 1st EXPERT USERS ON THE X-PEEM 
  • STXM delivery, installation and tests
3rd Semester 2012  
  • STXM test and commissioning with the beam
  • FIRST BEAM ON THE STXM
  • BEAMLINE OPEN FOR THE X-PEEM USERS
4th Semester 2012  
  • 1st EXPERT USERS ON THE STXM
1st Semester 2013  
  • BEAMLINE FULLY OPERATIONAL AND OPEN TO THE USERS


 
Useful information

HERMES X-PEEM Images Analysis using IgorPro:

  • Download the X-PEEM Images Analysis IgorPro procedure file: download
  • Copy this procedure file in the folder ...\WaveMetrics\Igor Pro Folder\Igor Procedures or ...\Documents\WaveMetrics\Igor Pro 6 User Files\Igor Procedures
  • The X-PEEM Images Analysis panel is now usable in IgorPro
  • You can use the short user manual of the X-PEEM Images Analysis procedures: download

 

 
 Contacts

 HERMES beamline description

 Science at HERMES

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