This beamline has been designed for a complete electronic structure determination using scanning-angle-resolved photoemission spectromicroscopy combined with a local structural characterization by means of Photoelectron Diffraction (PED) through its both modes, Forward scattering and Backscattering energy regimes. The central part of the project is focused on a finely tuned Fermi Surface Mapping study of crystalline complex materials with sub-micron (nano) spatial discrimination. The beamline consistently satisfies the conditions of a high-energy resolution and high-flux source of photons at the nano-size focal point provided by a Zone Plate (ZP) and order selection aperture (OSA) system. A spatial-scan sample manipulator with a resolution better than 30nm will control the temperature, angular and spatial position of the sample.
12-1000 eV (without Zone Plates) 95-1000 eV (with Zone Plates)
Energy Resolution (∆E/E)
>20000 (10-150 eV) >10000 (150-1000 eV)
- HU256 (256 mm period) electromagnetic - HU60 (60 mm period) permanent magnet – type AppleII - Variable polarization light: lineal H and V, circular
Flux at the first optical element
1.2•10+15 Photons/s/0.1% BP @ 100 eV
- PGM without entrance slits, using plane gratings with varied line spacing (VLS) and variable groove depth (VGP) 2 gratings (600 tr/mm and 1300 tr/mm) - Double Pseudo-Wolter (Focus on Sample and Using Zone Plates) - 2 Fresnel Zone Plates
- 5 axis High precision sample manipulator (better than 1 micron resolution) - Scan sample Manipulator (x,y,z) (resolution better than 5 nm) - The sample can be cooled down thanks to a liquid He cryostat.
Flux on sample
-Without Zone Plate:~ 5•10+12 Photons/s/0.1% BP (@ 100 eV) (E/ΔE = 10000) -Using ZP : 5•10+10 -10+11 Photons/s/0.1% BP
- High energy and angle resolution kinetic energy electron analyzer (Scienta R4000) - Low Energy Fluorescence Detector