Groupe optique

Moreno, T., Otero, E., & Ohresser, P.
In situ characterization of undulator magnetic fields.
Journal of Synchrotron Radiation, 2012, 19(2): 179-184
 
Nahon, L., de Oliveira, N., Garcia, G. A., Gil, J. F., Pilette, B., Marcouille, O., Lagarde, B., & Polack, F.
DESIRS: a state-of-the-art VUV beamline featuring high resolution and variable polarization for spectroscopy and dichroism at SOLEIL.
Journal of Synchrotron Radiation, 2012, 19(on-line first). 
 
Yousef, I., Lefrançois, S., Moreno, T., Hoorani, H., Makahleh, F., Nadji, A., & Dumas, P.
Simulation and design of an infrared beamline for SESAME (Synchrotron-Light for Experimental Science and Applications in the Middle East).
Nuclear Instruments and Methods A, 2012, 673(1): 73–81

Chauvet, C., Polack, F., Silly, M. G., Lagarde, B., Thomasset, M., Kubsky, S., Duval, J. P., Risterucci, P., Pilette, B., Yao, I., Bergeard, N., & Sirotti, F. 
Carbon contamination of soft X-ray beamlines: dramatic anti-reflection coating effects observed in the 1 keV photon energy region.
Journal of Synchrotron Radiation, 2011,  18(5): 761-764

Choueikani, F., Delmotte, F., Polack, F., Bridou, F., Lagarde, B., & Idir, M.
Étude des multicouches B4C/Mo pour la réalisation des réseaux multicouches alternés à efficacité élevée dans le domaine 1–5 KeV.
UVX 2010 - 10e Colloque sur les Sources Cohérentes et Incohérentes UV, VUV et X ; Applications et Développements Récents: 181-185. EDP Sciences 2011
 
Dong, X., Moreno, T., Guignot, N., & Itié, J. P.
Ray tracing application in hard x-ray optical development: Soleil first wiggler beamline (PSICHE) case.
Advances in Computational Methods for X-Ray Optics II, 21 August 2011, San Diego (US). Proceeding SPIE 2011, 8141, art.n° 814113
 
Modi, M. H., Lodha, G. S., Thomasset, M., & Idir, M.
Study of Micro Roughness Parameters and Growth Characteristics of NbC/Si Multilayer using Layer by Layer Power Spectral Density Analysis.
SOLID STATE PHYSICS, PROCEEDINGS OF THE 55TH DAE SOLID STATE PHYSICS SYMPOSIUM 2010 - Manipal, (India), 26–30 December 2010, AIP Conference Proceedings 2011, 1349, 715-716 
 
Moreno, T., Otero, E., Dong, X., & Ohresser, P.
Undulator emission analysis: comparison between measurements and simulations. 
Advances in Computational Methods for X-Ray Optics II, 21 August 2011, San Diego (US). Proceeding SPIE 2011, 8141, art.n° 81410H
 
Somogyi, A., Kewish, C. M., Polack, F., & Moreno, T.
The Scanning Nanoprobe Beamline Nanoscopium at Synchrotron Soleil.
10th International Conference on X-ray Microscopy, 15-20/08/2010, Chicago (US). AIP Conference Proceedings, 2011, 1365, 57-60

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Idir, M., Mercere, P., Moreno, T., Delmotte, A., Da Silva, P., & Modi, M. H.
Metrology and Tests beamline at SOLEIL Design and first results.
AIP Conference Proceedings, 2010, 1234: 485-488.
(SRI 2009, Melbourne, Australia, 27 September - 2 October 2009).

Polack, F., Thomasset, M., Brochet, S., & Rommeveaux, A.
A LTP stitching procedure with compensation of instrument errors: Comparison of SOLEIL and ESRF results on strongly curved mirrors.
Nuclear Instruments and Methods A, 2010, 616(2-3): 207-211
 
Polack, F., Silly, M. G., Chauvet, C., Lagarde, B., Bergeard, N., Izquierdo, M., Chubar, O., Krizmancic, D., Ribbens, M., Duval, J. P., Basset, C., Kubsky, S., & Sirotti, F.
TEMPO: a New Insertion Device Beamline at SOLEIL for Time Resolved Photoelectron Spectroscopy Experiments on Solids and Interfaces.
AIP Conference Proceedings, 2010, 1234: 185-188.
(SRI 2009, Melbourne, Australia, 27 September - 2 October 2009). 
 
Somogyi, A., Polack, F., & Moreno, T.
Nanoscopium: a Scanning Hard X-ray Nanoprobe Beamline at Synchrotron Soleil.
AIP Conference Proceedings, 2010, 1234: 395-398.
(SRI 2009, Melbourne, Australia, 27 September - 2 October 2009). 
 
Thomasset, M., Moreno, T., Capitanio, B., Idir, M., & Bucourt, S.
In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation.
Nuclear Instruments and Methods A, 2010, 616(2-3): 197-202

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de Oliveira, N., Joyeux, D., Phalippou, D., Rodier, J. C., Polack, F., Vervloet, M., & Nahon, L.
A Fourier transform spectrometer without a beam splitter for the vacuum ultraviolet range: From the optical design to the first UV spectrum
Review of Scientific Instruments, 2009, 80(4): art.n°043101  
 
Giuliani, A., Jamme, F., Rouam, V., Wien, F., Giorgetta, J. L., Lagarde, B., Chubar, O., Bac, S., Yao, I., Rey, S., Herbeaux , C., Marlats, J. L., Zerbib, D., Polack, F., & Réfregiers, M.
DISCO: a low-energy multipurpose beamline at synchrotron SOLEIL.
Journal of Synchrotron Radiation., 2009, 16(6): 835-841
   
Modi, M. H., Rai, S. K., Thomasset, M., Lodha, G. S., & Idir, M.
Effect of surface roughness on multilayer film growth
European-physical-journal.-Special Topics, 2009, 167(1): 27-32

Panaccione, G., Vobornik, I., Fujii, J., Krizmancic, D., Annese, E., Giovanelli, L., Maccherozzi, F., Salvador, F., De Luisa, A., Benedetti, D., Gruden, A., Bertoch, P., Polack, F., Cocco, D., Sostero, G., Diviacco, B., Hochstrasser, M., Maier, U., Pescia, D., Back, C. H., Greber, T., Osterwalder, J., Galaktionov, M., Sancrotti, M., & Rossi, G.
Advanced photoelectric effect experiment beamline at Elettra: A surface science laboratory coupled with Synchrotron Radiation
Review of Scientific Instruments, 2009, 80(4): art.n°043105
 

Cocco, D. & Thomasset, M.
Measurement of Groove Density of Diffraction Gratings
In Modern Developments in X-Ray and Neutron Optics, Springer Series in Optical Sciences Vol. 137: 207-211.Springer-Verlag (2008).

de Rossi, S., Joyeux, D., Chavel, P., de Oliveira, N., Richard, M., Constancias, C., & Robic, J. Y.
Probing multilayer stack reflectors by low coherence interferometry in extreme ultraviolet
Applied Optics, 2008, 147(12): 2109-2115
 
Desjardins, K., Hustache, S., Polack, F., Moreno, T., Dubuisson, J. M., Chubar, O., & Delmotte, F.
The DiagOn : an Undulator Diagnostic for SOLEIL Low Energy Beamlines
IEEE Nuclear Science Symposium/Medical Imaging Conference, 19-25 October 2008, Dresden (DE).
 
Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Moreno, T., & Brochet, S.
A Shack-Hartmann measuring head for the two-dimensional characterization of X-ray mirrors
Journal of Synchrotron Radiation, 2008, 15(2): 134-139
 
Joyeux, D., de Oliveira, M. A., Phalippou, D., Rodier, J. C., Ito, K., Nahon, L., Vervloet, M., Polack, F., & Roudjane, M.
Spectrométrie VUV par transformation de Fourier à très haute résolution : état et performances du nouvel instrument installé à SOLEIL
UVX 2008 - 9e Colloque sur les Sources cohérentes et incohérentes UV, VUV et X - Applications et développements récents, 7-10 octobre 2008, Dourdan (FR).

Rommeveaux, A., Thomasset, M., & Cocco, D.  
The Long Trace Profilers
In Modern Developments in X-Ray and Neutron Optics, Springer Series in Optical Sciences Vol. 137: 181-191.Springer-Verlag (2008).

Rommeveaux, A., Thomasset, M., Cocco, D., & Siewert, F.  
The COST P7 Round Robin for Slope Measuring Profilers
In Modern Developments in X-Ray and Neutron Optics, Springer Series in Optical Sciences Vol. 137: 213-218. Springer-Verlag (2008).

Stötzel, J., Lützenkirchen-Hecht, D., Fonda, E., De Oliveira, N., Briois, V., & Frahm, R.  
Novel angular encoder for a quick-extended x-ray absorption fine structure monochromator
Review of Scientific Instruments, 2008, 79(8): art.n°083107

Thomasset, M. & Polack, F.
Characterization of optical surfaces for the present generations of synchrotron sources
Proceedings of SPIE, 2008, 7155: art.n° 715506

Thomasset, M. & Polack, F.
Simultaneous estimation of the surface shape and the instrument error function from a highly redundant set of LTP data.
2nd Workshop on X-ray and XUV Active Optics  9-11 October 2008 Trieste (IT).

Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercere, P., Brochet, S., & Moreno, T.
Surface metrology with a stitching Shack-Hartmann profilometric head
Proceedings of SPIE, 2007, 6616 : 62

Sacchi, M., Spezzani, C., Carpentiero, A., Prasciolu, M., Delaunay, R., Lüning, J., & Polack, F.
Experimental setup for lensless imaging via soft x-ray resonant scattering
Review of Scientific Instruments, 2007, 78(4): Art. n° 043702.

Susini, J., Cotte, M., Scheidt, K., Chubar, O., Polack, F., & Dumas, P.
The FTIR spectro microscopy end-station at the ESRF-ID21 beamline
Synchrotron Radiation News, 2007, 20(5): 13-16 

Chubar, O., Susini, J., Cotte, M., Polack, F., Lagarde, B., Scheidt, K., Elleaume, P., & Dumas, P.
Simulation and Optimization of Synchrotron Infrared Micro-Spectroscopic Beamlines using Wave Optics Computation: ESRF and SOLEIL's Cases.
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 607-610

de Oliveira, N., Joyeux, D., Phalippou, D., Rodier, J. C., Nahon, L., Polack, F., & Vervloet, M.
A High Precision Scanning Control System For A VUV Fourier Transform Spectrometer.  
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 447-450.

Desjardins, K., Hustache, S., Polack, F., Moreno, T., Idir, M., Dubuisson, J. M., Daguerre, J. P., Giorgetta, J. L., Thoraud, S., Delmotte, F., & Ravet-Krill, M. F.  
The DiagOn : an Undulator Diagnostic for SOLEIL Low Energy Beamlines.
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 1101-1104  

Floriot J., Levecq X., Bucourt S., Thomasset M., Brochet S., Polack F., Idir M., Mercère P. & Moreno T.  
Shack-Hartmann long trace profiler : A new generation of 2D LTP.
Synchrotron Radiation News, 2006, 19(4): 24-27  

Idir, M., Brochet, S., Delmotte, A., Lagarde, B., Mercère, P., Moreno, T., Polack, F., & Thomasset, M.
Le pôle de métrologie de SOLEIL.
Journal de physique  IV, 2006, 138: 265-274

Idir, M., Mercère, P., Moreno, T., & Delmotte, A. 2006.
Metrology and Tests Beamline at SOLEIL.
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 619-622

Mercère, P., Idir, M., Moreno, T., Cauchon, G., Dovillaire, G., Levecq, X., & Bucourt, S.  
Wavefront Closed-Loop Correction for X-Ray Microfocusing Active Optics.
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 722-725

Mercère, P., Idir, M., Moreno, T., Cauchon, G., Dovillaire, G., Levecq, X., & Bucourt, S.
X-Ray Wavefront Measurements And Automatic Alignment Of X-Ray Beamlines
Third International Workshop on Metrology for X-ray Optics- SRI 2006, Pohang (KO), 28 may-02 june 2006, Abstract No.34030008

Moreno, T., Belkhou, R., Cauchon, G., Idir, M., & Mercère, P.  
New Optical Setup for the Generation of Variable Spot Size on Third Generation Synchrotron Beam lines.
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 455-458

Polack, F., Lagarde, B., Idir, M., Liard, A., Jourdain, E., Roulliay, M., Delmotte, A., Gautier, J., & Ravet-Krill, M. F.  
Alternate Multilayer Gratings with Enhanced Diffraction Efficiency in the 500-5000 eV Energy Domain.
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 489-492  

Polack, F., Lagarde, B., Idir, M., Liard, A., & Jourdain, E.  
Variable Groove Depth Gratings and their Applications in Soft X-ray Monochromators.
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 639-642

Polack, F., Lagarde, B., & Idir, M.  
A High Resolution Soft X-ray Monochromator Focused by the Holographic Effect of a VLS grating.
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 655-658

Siewert, F., Assoufid, L., Cocco, D., Hignette, O., Irick, S., Lammert, H., McKinney, W., Ohashi, H., Polack, F., Qian, S., Rah, S., Rommeveaux, A., Schönherr, V., Sostero, G., Takacs, P., Thomasset, M., Yamauchi, K., Yashchuk, V., & Zeschke, T.  Global High-Accuracy Intercomparison of Slope Measuring Instruments.
Ninth International Conference on Synchrotron Radiation Instrumentation, Daegu (KO), 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 706-709

Thomasset, M., Brochet, S., Idir, M., Moreno, T., Polack, F., & Carré, J.F.
Metrology results on multielectrod bimorph mirrors.  
Third International Workshop on Metrology for X-ray Optics- SRI 2006, Pohang (KO), 28 may-02 june 2006, Abstract No.34050015

Belin, S., Briois, V., Traverse, A., Idir, M., Moreno, T., & Ribbens, M.
SAMBA a new beamline at SOLEIL for x-ray absorption spectroscopy in the 4-40 keV energy range.
Physica Scripta T, 115: 980-983 (2005)

Farys, V., Schiavone, P., Polack, F., Idir, M., Bertolo, M., Bianco, A., La-Rosa, S., Cautero, G., Vannuffel, C., Quesnel, E. & Muffato, V.
Highly sensitive detection technique of buried defects in extreme ultraviolet masks using at-wavelength scanning dark-field microscopy.
Applied Physics Letters, 2005, 87(2): art. no. 024102

Joyeux D., de Oliveira N., Phalippou D., Rodier J.C., Vervloet M., Polack F. & Nahon L.
A spectrometer by Fourier transformation without separating wave, for VUV-XUV. Principles, implementation, and primary results.
Journal de physique IV, 2005, 127: 77-85

Mercère, P., Bucourt, S., Cauchon, G., Douillet, D., Dovillaire, G., Goldberg, K. A., Idir, M., Levecq, X., Moreno, T., Naulleau, P. P., Rekawa, S. & Zeitoun, P.
X-ray beam metrology and X-ray optic alignment by Hartmann wavefront sensing.
SPIE's 50th Annual Meeting, X-Ray Systems and Technologies : Advances in Metrology for X-Ray and EUV Optics, San Diego (US) 2-3 August 2005, 63-72

Moreno, T., Belkhou, R., Cauchon, G. & Idir, M.
New optical setup for the generation of variable spot size on third generation synchrotron beamlines.
Advances in metrology for x-ray and EUV optics, San Diego (US), 2-3 August 2005, Proc. SPIE 5921, 59210F.59211-59210F.59217, 2005

Polack, F., Idir, M., Jourdain, E., & Liard, A.
Réseau de diffraction à empilements multicouches alternés et son procédé de fabrication et dispositifs spectroscopiques comportant ces réseaux
Diffraction grating for spectroscopic device, has two periodic thin layer stackings constituted of layers of two different materials, where staking form parallel traces separated from surface and spaced periodically
France: Jobin-Yvon SAS et Synchrotron SOLEIL. Patent n° FR2864252-A1; WO2005064364-A1; US2005270647-A1; EP1700141-A1; JP2007515689-W  (2005).

Rommeveaux, A., Thomasset, M., Cocco, D. & Siewert, F.  
First report on a European Round Robin for slope measuring profilers.
Advances in metrology for x-ray and EUV optics, San Diego (US) 2-3 August 2005, Proc. SPIE 5921, 59210I.59211-59210I.59212, 2005 .

Thomasset M., Brochet S. & Polack F.  
Latest metrology results with the SOLEIL synchrotron LTP.
Advances in metrology for x-ray and EUV optics, 2-3 August 2005, San Diego (US) :592102.-592109

Nadji, A., Chubar, O., Idir, M., Level, M. P., Loulergue, A., Moreno, T., Nadolski, L. S., & Polack, F.
Femto-second Electron Beam Slicing Project at SOLEIL
European Particle Accelerator Conf. 9th, 5-9 July 2004, Lucerne (CH). pp. 1675-1677