Ligne METROLOGIE

Medjoubi, K., Thompson, A., Bérar, J. F., Clemens, J. C., Delpierre, P., Da Silva, P., Dinkespiler, B., Fourme, R., Gourhant, P., Guimaraes, B. G., Hustache, S., Idir, M., Itié, J. P., Legrand, P., Menneglier, C., Mercere, P., Picca, F., & Samama, J. P.
Energy resolution of the CdTe-XPAD detector: calibration and potential for Laue diffraction measurements on protein crystals.
Journal of Synchrotron Radiation, 2012, 19 19(3): 323-331

Bachelard, R., Mercère, P., Idir, M., Couprie, M. E., Labat, M., Chubar, O., Lambert, G., Zeitoun, P., Kimura, H., Ohashi, H., Higashiya, A., Yabashi, M., Nagasono, M., Hara, T., & Ishikawa, T.
Wavefront Analysis of Nonlinear Self-Amplified Spontaneous-Emission Free-Electron Laser Harmonics in the Single-Shot Regime.
Physical Review Letters, 2011, 106(23): art.n° 234801
 
Choueikani, F., Delmotte, F., Polack, F., Bridou, F., Lagarde, B., & Idir, M. 
Étude des multicouches B4C/Mo pour la réalisation des réseaux multicouches alternés à efficacité élevée dans le domaine 1–5 KeV.
UVX 2010 - 10e Colloque sur les Sources Cohérentes et Incohérentes UV, VUV et X ; Applications et Développements Récents: 181-185. EDP Sciences 2011
 
Firsov, A., Belkhou, R., Idir, M., Svintsov, A., Zaitsev, S., Ferlazzo, L., & Cambril, E.
Germanium-Based Circular Zone Plates for Soft and Hard X-Rays.
10th International Conference on X-ray Microscopy, 15-20/08/2010, Chicago (US). AIP Conference Proceedings, 2011, 1365, 84-87
 
 Ménesguen & Lépy, M. C.
Characterization of the Metrology beamline at the SOLEIL synchrotron and application to the determination of mass attenuation coefficients of Ag and Sn in the range 3.5<E<28keV.
X-Ray Spectrometry, 2011, 40(6): 411-416
 
Modi, M. H., Lodha, G. S., Thomasset, M., & Idir, M.
Study of Micro Roughness Parameters and Growth Characteristics of NbC/Si Multilayer using Layer by Layer Power Spectral Density Analysis.
SOLID STATE PHYSICS, PROCEEDINGS OF THE 55TH DAE SOLID STATE PHYSICS SYMPOSIUM 2010 - Manipal, (India), 26–30 December 2010, AIP Conference Proceedings 2011, 1349, 715-716 
 
Reverchon, J. L., Lehoucq, G., Lyoret, C., Truffer, J. P., Costard, E., Frayssinet, E., Brault, D., Duboz, J. Y., Giuliani, A., Refregiers, M., & Idir, M.
Performances and reliability tests of AlGaN based focal plane array for deep-UV imaging.
Sensors, Systems, and Next-Generation Satellites XV, Prague (CZ), 19 September 2011, SPIE Proceedings, 2011, 8176: art.n° 817619
 
Rizzi, J., Weitkamp, T., Guérineau, N., Idir, M., Mercère, P., Druart, V., Vincent, G., Da Silva, P., & Primot, J.
Quadriwave lateral shearing interferometry in an achromatic and continuously self-imaging regime for future x-ray phase imaging.
Optics Letters, 2011, 36(8): 1398-1400

Duboz, J. Y., Frayssinet, E., Chenot, S., Reverchon, J. L., & Idir, M.
X-ray detectors based on GaN Schottky diodes.
Applied Physics Letters, 2010, 97(16): art.n°163504 
 
Idir, M., Mercère, P., Modi, M. H., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., & Sauvageot, P.
X-ray active mirror coupled with a Hartmann Wavefront Sensor.
Nuclear Instruments and Methods A, 2010, 616(2-3): 162-171 
 
Idir, M., Fricker, S., Modi, M. H., & Potier, J.
X-ray digital wavefront sensor development.
Nuclear Instruments and Methods A, 2010, 616(2-3): 255-260 
 
Idir, M., Mercère, P., Moreno, T., Delmotte, A., Da Silva, P., & Modi, M. H.
Metrology and Tests beamline at SOLEIL Design and first results.
AIP Conference Proceedings, 2010, 1234: 485-488.
SRI 2009, Melbourne, Australia, 27 September - 2 October 2009). 
 
Idir, M., Potier, J., Fricker, S., Snigirev, A., Snigireva, I., & Modi, M. H.
X-ray Phase Contrast analysis—Digital wavefront development.
AIP Conference Proceedings, 2010, 1234: 677-680.
(SRI 2009, Melbourne, Australia, 27 September - 2 October 2009). 
 
Mercère, P., Idir, M., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., & Sauvageot, P.
Hartmann wavefront sensor and adaptive x-ray optics developments for synchrotron applications.
Proceedings of SPIE, 2010, 7803: art.n°780302 
   
Modi, M. H. & Idir, M.
Shape error analysis for reflective nano focusing optics.
AIP Conference Proceedings, 2010, 1234: 681-684.
(SRI 2009, Melbourne, Australia, 27 September - 2 October 2009). 
 
Reverchon, J. L., Bansropun, S., Truffer, J. P., Costard, E., Frayssinet, E., Brault, J., Duboz, J. Y., Giuliani, A., & Idir, M.
Performances of AlGaN-based focal plane arrays from 10nm to 200nm.
Proceedings of SPIE, 2010, 7691: art.n°769109 
 
Thomasset, M., Moreno, T., Capitanio, B., Idir, M., & Bucourt, S.
In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation.
Nuclear Instruments and Methods A, 2010, 616(2-3): 197-202

Lee, R. W., Nagler, B., Zastrau, U., Fäustlin, R. R., Vinko, S. M., Whitcher, T., Sobierajski, R., Krzywinski, J., Juha, L., Nelson, A. J., Bajt, S., Budil, K., Cauble, R. C., Bornath, T., Burian, T., Chalupsky, J., Chapman, H., Cihelka, J., Döppner, T., Dzelzainis, T., Düsterer, S., Fajardo, M., Förster, E., Fortmann, C., Glenzer, S. H., Göde, S., Gregori, G., Hajkova, V., Heimann, P., Jurek, M., Khattak, F. Y., Khorsand, A. R., Klinger, D., Kozlova, M., Laarmann, T., Lee, H. J., Meiwes-Broer, K. H., Mercere, P., Murphy, W. J., Przystawik, A., Redmer, R., Reinholz, H., Riley, D., Röpke, G., Saksl, K., Thiele, R., Tiggesbäumker, J., Toleikis, S., Tschentscher, T., Uschmann, I., Falcone, R. W., Shepherd, R., Hastings, J. B., White, E., & Wark, J. S.
Perspective for high energy density studies on x-ray FELs.
Proceedings of SPIE, 2009, 7451: 74510E
 
Mercère, P., Bachelard, R., Couprie, M. E., Idir, M., Chubar, O., Gautier, J., Lambert, G., Zeitoun, P., Bucourt, S., Dovillaire, G., Levecq, X., Kimura, H., Ohashi, H., Hara, T., Higashiya, A., Ishikawa, T., Nagasono, M., & Yabashi, M.
Spatial characterization of SASE-FEL of SCSS Test Accelerator.
31st International FEL Conference, Liverpool (UK), August 23-28, 2009, abs.n° WEOD03 
 
Modi, M. H., Rai, S. K., Thomasset, M., Lodha, G. S., & Idir, M.
Effect of surface roughness on multilayer film growth
European-physical-journal.-Special Topics, 2009, 167(1): 27-32
 
Modi, M. H., Mercere, P., & Idir, M.
High precision surface metrology using a phase retrieval method.
Journal of Physics Conferences Series, 2009, 186: art.n°012068
 
Nagler, B., Zastrau, U., Fäustlin, R. R., Vinko, S. M., Whitcher, T., Nelson, A. J., Sobierajski, R., Krzywinski, J., Chalupsky, J., Abreu, E., Bajt, S., Bornath, T., Burian, T., Chapman, H., Cihelka, J., Döppner, T., Düsterer, S., Dzelzainis, T., Fajardo, M., Förster, E., Fortmann, C., Galtier, E., Glenzer, S. H., Göde, S., Gregori, G., Hajkova, V., Heimann, P., Juha, L., Jurek, M., Khattak, F. Y., Khorsand, A. R., Dorota Klinger, D., Kozlova, M., Laarmann, T., Lee, H. J., Lee, R. W., Meiwes-Broer, K. H., Mercere, P., Murphy, W. J., Przystawik, A., Redmer, R., Reinholz, H., Riley, D., Röpke, G., Rosmej, F., Saksl, K., Schott, R., Thiele, R., Tiggesbäumker, J., Toleikis, S., Tschentscher, T., Uschmann, I., Vollmer, H. J., & Wark, J. S.
Turning solid aluminium transparent by intense soft X-ray photoionization.
Nature Physics, 2009, 5(9): 693-696
 
Reverchon, J. L., Bansropun, S., Robo, J. A., Truffer, J. P., Costard, E., Frayssinet, E., Brault, J., Semond, F., Duboz, J. Y., & Idir, M.
First demonstration and performances of AlGaN based focal plane array for deep-UV imaging
Proceedings of SPIE, 2009, 7474: FPA II -74741G

Couprie, M. E., Loulergue, A., Benabderrahmane, C., Chubar, O., Denard, J. C., Filhol, J. M., Idir, M., Labat, M., Lestrade, A., Louvet, M., Marchand, P., Marcouillé, O., Mercère, P., Nadolski, L., Nahon, L., Dumas, P., Morin, P., Bruni, C., Lambert, G., Zeitoun, P., Garzella, D., Meyer, M., Lüning, J., Collet, E., & Giannessi, L.
The ARC-EN-CIEL fourth generation light source proposal.
30th International FEL Conference, Gyeongju, Korea, August 24-29, 2008., Gyeongju, (KO). abs.n° MOPPH066
 
Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Moreno, T., & Brochet, S.
A Shack-Hartmann measuring head for the two-dimensional characterization of X-ray mirrors
Journal of Synchrotron Radiation, 2008, 15(2): 134-139

Gautier, J., Zeitoun, P., Hauri, C., Morlens, A. S., Rey, G., Valentin, C., Papalarazou, E., Goddet, J. P., Sebban, S., Burgy, F., Mercere, P., Idir, M., Dovillaire, G., Levecq, X., Bucourt, S., Fajardo, M., Merdji, H., & Caumes, J. P.
Optimization of the wave front of high order harmonics
European physical journal D, 2008, 48(3): 459-463

Idir, M., Mercere, P., Modi, M. H., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., & Sauvageot, P.
X-ray active mirror coupled with a Hartmann wavefront analyser.
2nd Workshop on X-ray and XUV Active Optics  9-11 October 2008 Trieste (IT).

Mercère, P., Idir, M., Floriot, J., & Levecq, X.
Hartmann and Shack–Hartmann Wavefront Sensors for Sub-nanometric Metrology
 In Modern Developments in X-Ray and Neutron Optics, Springer Series in Optical Sciences Vol. 137: 219-232. Springer-Verlag (2008).

Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercere, P., Brochet, S., & Moreno, T.
Surface metrology with a stitching Shack-Hartmann profilometric head
Proceedings of SPIE, 2007, 6616 : 62

Reverchon, J.L., Robo, J.A., Truffer, J.P., Caumes, J.P., Idir, M., Brault, J., & Duboz, J.Y.
AlGaN-based focal plane arrays for selective UV imaging at 310nm and 280nm and route toward deep UV imaging
Proceedings of SPIE, 2007, 6744: art. n°674417

Desjardins, K., Hustache, S., Polack, F., Moreno, T., Idir, M., Dubuisson, J. M., Daguerre, J.P., Giorgetta, J.L., Thoraud, S., Delmotte, F., & Ravet-Krill, M. F.  
The DiagOn : an Undulator Diagnostic for SOLEIL Low Energy Beamlines.
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 1101-1104  

Flank, A.M., Cauchon, G., Lagarde, P., Bac, S., Janousch, M., Wetter, R., Dubuisson, J. M., Idir, M., Langlois, F., Moreno, T. & Vantelon, D.
LUCIA, a microfocus soft XAS beamline.
NIM B, 2006, 246(1): 269-274

Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Brochet, S., Polack, F., Idir, M., Mercère, P. & Moreno, T.   
Shack-Hartmann long trace profiler : A new generation of 2D LTP.
Synchrotron Radiation News, 2006, 19(4): 24-27  

Hecquet, C., Roulliay, M., Delmotte, F., Ravet-Krill, M.F., Hardouin, A., Idir, M., & Zeitoun, P.  "
EUV large spectrum reflectometry for the metrology of optics.
Journal de physique  IV, 138: 259-264 (2006).

Idir, M., Mercère, P., Moreno, T. & Delmotte, A.   
Metrology and test beamline at SOLEIL.
Synchrotron Radiation News, 2006, 19(4): 18-23

Idir, M., Mercère, P., Moreno, T., & Delmotte, A.
Metrology and Tests Beamline at SOLEIL. Paper presented at the
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 619-622

Idir, M., Brochet, S., Delmotte, A., Lagarde, B., Mercère, P., Moreno, T., Polack, F., & Thomasset, M.
Le pôle de métrologie de SOLEIL.
Journal de physique  IV, 2006, 138: 265-274

Itié, J.P., Flank, A.M., Lagarde, P., Polian, A., Couzinet, B., & Idir, M. 
Extension to Low Energies (<7keV) of High Pressure X-Ray Absorption Spectroscopy.  
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 1329-1332

Mercère, P., Idir, M., Moreno, T. & Cauchon, G.
X-ray wave-front measurements and X-ray active optics.
Synchrotron Radiation News, 2006, 19(4): 28-32

Mercère, P., Idir, M., Moreno, T., Cauchon, G., Dovillaire, G., Levecq, X., Couvet, L., Bucourt, S. & Zeitoun, P.
Automatic alignment of a Kirkpatrick-Baez active optic by use of a soft X-ray Hartmann wave-front sensor.
Optics Letters, 2006, 31(2): 199-201

Mercère, P., Idir, M., Moreno, T., Cauchon, G., Dovillaire, G., Levecq, X., & Bucourt, S.  
Wavefront Closed-Loop Correction for X-Ray Microfocusing Active Optics.
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 722-725

Mercère, P., Idir, M., Moreno, T., Cauchon, G., Dovillaire, G., Levecq, X., & Bucourt, S.
X-Ray Wavefront Measurements And Automatic Alignment Of X-Ray Beamlines
Third International Workshop on Metrology for X-ray Optics- SRI 2006, Pohang (KO), 28 may-02 june 2006, Abstract No.34030008

Moreno, T., Belkhou, R., Cauchon, G., Idir, M., & Mercère, P.  
New Optical Setup for the Generation of Variable Spot Size on Third Generation Synchrotron Beam lines.
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 455-458

Polack, F., Lagarde, B., Idir, M., Liard, A., Jourdain, E., Roulliay, M., Delmotte, A., Gautier, J. & Ravet-Krill, M.F.  
Alternate Multilayer Gratings with Enhanced Diffraction Efficiency in the 500-5000 eV Energy Domain.
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 489-492  

Polack, F., Lagarde, B., Idir, M., Liard, A. & Jourdain, E.  
Variable Groove Depth Gratings and their Applications in Soft X-ray Monochromators.
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 639-642

Polack, F., Lagarde, B. & Idir, M.  
A High Resolution Soft X-ray Monochromator Focused by the Holographic Effect of a VLS grating.
Ninth International Conference on Synchrotron Radiation Instrumentation Daegu (KO) 28 May-2 June 2006, AIP Conference Proceedings 2007, 879: 655-658

Belin, S., Briois, V., Traverse, A., Idir, M., Moreno, T., & Ribbens, M.
SAMBA a new beamline at SOLEIL for x-ray absorption spectroscopy in the 4-40 keV energy range.
Physica Scripta T, 115: 980-983 (2005)

Farys, V., Schiavone, P., Polack, F., Idir, M., Bertolo, M., Bianco, A., La-Rosa, S., Cautero, G., Vannuffel, C., Quesnel, E. & Muffato, V.
Highly sensitive detection technique of buried defects in extreme ultraviolet masks using at-wavelength scanning dark-field microscopy.
Applied Physics Letters, 2005, 87(2): art. no. 024102

Mercère, P., Bucourt, S., Cauchon, G., Douillet, D., Dovillaire, G., Goldberg, K. A., Idir, M., Levecq, X., Moreno, T., Naulleau, P.P., Rekawa, S. & Zeitoun, P.
X-ray beam metrology and X-ray optic alignment by Hartmann wavefront sensing.
SPIE's 50th Annual Meeting, X-Ray Systems and Technologies : Advances in Metrology for X-Ray and EUV Optics, San Diego (US) 2-3 August 2005, 63-72

Moreno, T., Belkhou, R., Cauchon, G. & Idir, M.
New optical setup for the generation of variable spot size on third generation synchrotron beamlines.
Advances in metrology for x-ray and EUV optics, San Diego (US), 2-3 August 2005, Proc. SPIE 5921, 59210F.59211-59210F.59217, 2005

Polack, F., Idir, M., Jourdain, E., & Liard, A.
Réseau de diffraction à empilements multicouches alternés et son procédé de fabrication et dispositifs spectroscopiques comportant ces réseaux
Diffraction grating for spectroscopic device, has two periodic thin layer stackings constituted of layers of two different materials, where staking form parallel traces separated from surface and spaced periodically
France: Jobin-Yvon SAS et Synchrotron SOLEIL. Patent n° FR2864252-A1; WO2005064364-A1; US2005270647-A1; EP1700141-A1; JP2007515689-W  (2005).

Bridou F., Cauchon G. & Idir M.
Analyse de l'intensité de fluorescence émise par une multicouche périodique sous rayonnement synchrotron. Application à l'étude de la répartition spatiale des éléments dans l'empilement
Journal de physique. IV. Colloque. 2004, 118, 137-142

Nadji, A., Chubar, O., Idir, M., Level, M.P., Loulergue, A., Moreno, T., Nadolski, L.S., & Polack, F.
Femto-second Electron Beam Slicing Project at SOLEIL
European Particle Accelerator Conf. 9th, Lucerne (CH). pp. 1675-1677.

Hochedez, J.F., Appourchaux, T., Belsky, A., Castex, M. C., Deneuville, A., Dhez, P., Fleck, B., Hainaut, O., Idir, M., Kleider, J. P., Lemaire, P., Monroy, E., Munoz, E., Muret, P., Nesladek, M., Omnes, F., Pau, J., Peacock, A., Schuhle, U., & Van Hoof, C.
Diamond imager and nitrides for UV observation of the sun.
Journal de physique  IV, 108: 227-231 (2003).

Mercère, P., Idir, M., Zeitoun, P., Levecq, X., Dovillaire, G., Bucourt, S., Douillet, D., Goldberg, K. A., Naulleau, P. P., & Rekawa, S.
X ray Wavefront Hartmann Sensor.
8th International Conference on Synchrotron Radiation Instrumentation 25-29 August 2003, San Francisco (US) AIP Conference Proceedings, 705 : 819-822 (2004).