SOLEIL possesses a platform dedicated to metrology made up of:
- A beamline using the synchrotron beam for “wavelength” metrology
- An associated metrological laboratory for the conduction of classic metrology
The metrology beamline is equipped with several stations for the measuring of photometric parameters in the widest part of the spectrum covered by the synchrotron for the characterization of optic elements such as the reflectivity of surfaces, the efficiency of diffraction networks, the diffusion of surfaces, or the efficiency of X and X-UV detectors.
This facility is also planned for developing the instruments and diagnostics necessary for the characterization of X-ray beams (intensity, size, degree of coherence, polarization, etc).
The connected metrology laboratory uses instruments that are already on the market or in the process of development (prototypes) for the measurement of optic components (mirrors, crystals, networks, etc.).
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